Difference between revisions of "Scanning Electron Microscope"
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(New page: The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs are able to focus the beam E-beam lithog...) |
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Revision as of 14:51, 1 October 2009
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs are able to focus the beam E-beam lithography or are equipped for focused ion beam (FIB) milling.
See Wikipedia on Scanning Electron Microscope
Training Video on Hitachi 3500H SEM at GT MiRC