File:Angle resolved xps.jpg

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XPS is typically conducted with the sample perpendicular to the detector axis (normal takeoff angles) but if we want additional near-surface sensitivity we can tilt the sample. The above equation shows that tilting the sample gives us analytical information even closer to the surface

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current09:23, 22 April 2009Thumbnail for version as of 09:23, 22 April 2009960 × 720 (54 KB)Cmditradmin (talk | contribs)XPS is typically conducted with the sample perpendicular to the detector axis (normal takeoff angles) but if we want additional near-surface sensitivity we can tilt the sample. The above equation shows that tilting the sample gives us analytical informat

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