Ellipsometer
Revision as of 14:12, 15 June 2011 by Cmditradmin (talk | contribs)
| Return to Research Tool Menu |
Overview
An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films.
see wikipedia on Ellipsometry
Significance
Operation
Video on operation of a Woolam Ellipsometer at MiRC