Ellipsometer
Revision as of 13:08, 4 January 2010 by Cmditradmin (talk | contribs)
Return to Research Tool Menu |
Overview
An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films.
see wikipedia on Ellipsometry
Technique
Video on operation of a Woolam Ellipsometer at MiRC