Scanning Electron Microscope

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Overview

Sirion sem.png

The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs are able to focus the beam E-beam lithography or are equipped for focused ion beam (FIB) milling.

See Wikipedia on Scanning Electron Microscope


Operation

Video in production

Training Manual for Sirion SEM[1]

Training Video on Hitachi 3500H SEM at GT MiRC

Significance

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