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- 10:15, 12 November 2009 diff hist 0 Lasers and Telecommunication- Outreach Kit →User Guide
- 09:19, 5 October 2009 diff hist −1 Main Page →Basics of Light
- 09:18, 5 October 2009 diff hist −86 Propagation, Reflection and Refraction
- 09:18, 5 October 2009 diff hist +55 Propagation, Reflection and Refraction
- 09:17, 5 October 2009 diff hist +1,723 Propagation, Reflection and Refraction
- 09:08, 5 October 2009 diff hist 0 Propagation, Reflection and Refraction →Refraction
- 09:07, 5 October 2009 diff hist 0 Propagation, Reflection and Refraction →Refraction
- 09:05, 5 October 2009 diff hist +4 Propagation, Reflection and Refraction →Index of Refraction and Wavelength
- 08:59, 5 October 2009 diff hist +2 OLED Device Applications →Commercial OLED Products
- 08:59, 5 October 2009 diff hist +1 OLED Device Applications →External Links
- 08:59, 5 October 2009 diff hist +4 OLED Device Applications
- 08:59, 5 October 2009 diff hist +12 OLED Device Applications →Design Challenges
- 08:58, 5 October 2009 diff hist +193 OLED Device Applications
- 14:51, 1 October 2009 diff hist +477 N Scanning Electron Microscope New page: The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs are able to focus the beam E-beam lithog...
- 14:38, 1 October 2009 diff hist +58 Organic Photovoltaic Fabrication and Test Apparatus
- 14:37, 1 October 2009 diff hist +14 Conducting Tip Atomic Force Microscopy →Conducting Tip Atomic Force Microscopy
- 14:35, 1 October 2009 diff hist +21 Conducting Tip Atomic Force Microscopy →Conducting Tip Atomic Force Microscopy
- 14:34, 1 October 2009 diff hist +132 Spin coater
- 14:30, 1 October 2009 diff hist +433 N Spin coater New page: Spin coating is method to apply uniform thin coatings to substrates. It is widely used in microfabrication for applying photoresist. In photonics research it is used to directly fabricate ...
- 14:21, 1 October 2009 diff hist +4 Main Page →Research Equipment, Devices and Techniques
- 14:17, 1 October 2009 diff hist +23 Ellipsometer
- 14:16, 1 October 2009 diff hist +350 N Ellipsometer New page: === Overview === An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films. see wikipedia on [http://en.wikipedia.org/wi...
- 14:12, 1 October 2009 diff hist +42 Main Page →Research Equipment, Devices and Techniques
- 14:08, 1 October 2009 diff hist +29 Profilometer
- 14:06, 1 October 2009 diff hist +409 Profilometer
- 13:57, 1 October 2009 diff hist −2 Profilometer
- 13:55, 1 October 2009 diff hist +209 N Profilometer New page: see wikipedia http://en.wikipedia.org/wiki/Profilometer Profilometer Video instructions for the [http://grover.mirc.gatech.edu/training/viewVideo.php?video=wyko-high&size=0 Wyckoff Pr...
- 13:53, 1 October 2009 diff hist −4 Main Page →Research Equipment, Devices and Techniques
- 13:35, 1 October 2009 diff hist +18 Main Page →Research Equipment, Devices and Techniques
- 12:22, 1 October 2009 diff hist +1 Main Page →Research Equipment, Devices and Techniques
- 12:22, 1 October 2009 diff hist +23 Main Page →Research Equipment, Devices and Techniques
- 09:39, 1 October 2009 diff hist +32 Main Page →Research Equipment, Devices and Techniques
- 09:38, 1 October 2009 diff hist −1 Main Page →Research Equipment, Devices and Techniques
- 09:37, 1 October 2009 diff hist +29 Main Page →Research Equipment, Devices and Techniques
- 09:35, 1 October 2009 diff hist +347 Main Page →Research Equipment, Devices and Techniques
- 09:34, 1 October 2009 diff hist +63 Second-order Material Characterization →Hyper Rayleigh Scattering (HRS)
- 09:33, 1 October 2009 diff hist +899 N Hyper Rayleigh Scattering New page: Hyper Rayleigh Scattering (aka Harmonic Light Scattering) is one method for measuring β. thumb|300px|The Hyper Rayleigh Scattering - Test best schematic An incide...
- 09:32, 1 October 2009 diff hist +29 Second-order Material Characterization →Hyper Rayleigh Scattering (HRS)
- 09:31, 1 October 2009 diff hist −899 Second-order Material Characterization
- 09:31, 1 October 2009 diff hist +1,243 N Teng-Man Method New page: === Teng-Mann Method for Measuring Electro-optic coefficient=== thumb|400px|Teng-Man Testing configuration We use the Teng - Man method to measure R<sub>33</sub...
- 09:30, 1 October 2009 diff hist +60 Second-order Material Characterization →Hyper Rayleigh Scattering (HRS)
- 09:29, 1 October 2009 diff hist −1,227 Second-order Material Characterization →Electro-optic coefficient measurements
- 08:59, 1 October 2009 diff hist +1 Nanocrystalline - Dye Solar Cell Lab
- 08:56, 1 October 2009 diff hist +99 Nanocrystalline - Dye Solar Cell Lab →Scientific Background
- 08:54, 1 October 2009 diff hist +87 External Education Links →K-12 Educational Resources
- 08:44, 1 October 2009 diff hist +14 Main Page
- 08:43, 1 October 2009 diff hist −33 Main Page
- 15:41, 30 September 2009 diff hist +88 External Education Links →Photonics and Communications Technology
- 15:16, 30 September 2009 diff hist +5 Two-Photon Spectroscopy
- 15:16, 30 September 2009 diff hist +63 Two-Photon Spectroscopy