Difference between revisions of "Ellipsometer"
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An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films. | An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films. | ||
=== Significance === | === Significance === | ||
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=== External Links === | === External Links === | ||
*[[wikipedia:Ellipsometry]] | *[[wikipedia:Ellipsometry]] | ||
*[http://www.jawoollam.com/tutorial_1.html Woolam Ellipsometry Tutorial] | |||
Revision as of 15:30, 21 September 2011
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Overview
An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films.
Significance
Operation
Video on Woolam Ellipsometer at MiRC
Video on Woolam Ellipsometer at Cornell