Difference between revisions of "Transmission Electron Microscope"
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Revision as of 10:00, 15 September 2011
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Introduction
The transmission electron microscope (TEM) is used in photonics research as a way of visualizing and measuring extremely thin layers. It is well suited for this research because the devices and prototypes are often conductive, are extremely thin, and can withstand high vacuum.
Technique
Part 1
Part 2
Script for FEI tecnai f20:
<embed_document width="55%" height="400">/images/8/8f/TEM_script.pdf</embed_document>
External Links
See Wikipedia:Transmission_electron_microscope TEM