Difference between revisions of "Transmission Electron Microscope"
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=== Introduction === | |||
The transmission electron microscope (TEM) is used in photonics research as a way of visualizing and measuring extremely thin layers. It is well suited for this research because the devices and prototypes are often conductive, are extremely thin, and can withstand high vacuum. | The transmission electron microscope (TEM) is used in photonics research as a way of visualizing and measuring extremely thin layers. It is well suited for this research because the devices and prototypes are often conductive, are extremely thin, and can withstand high vacuum. | ||
=== Technique === | |||
=== External Links === | |||
See wikipedia on [http://en.wikipedia.org/wiki/Transmission_electron_microscope TEM] | See wikipedia on [http://en.wikipedia.org/wiki/Transmission_electron_microscope TEM] | ||
[http://www.youtube.com/watch?v=fToTFjwUc5M&feature=related Brief Youtube intro] | [http://www.youtube.com/watch?v=fToTFjwUc5M&feature=related Brief Youtube intro] | ||
Revision as of 12:39, 16 June 2010
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Introduction
The transmission electron microscope (TEM) is used in photonics research as a way of visualizing and measuring extremely thin layers. It is well suited for this research because the devices and prototypes are often conductive, are extremely thin, and can withstand high vacuum.
Technique
External Links
See wikipedia on TEM