Difference between revisions of "Attenuated Total Reflectance"

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:<math>V_m\,\!</math> is the AC modulation voltage
:<math>V_m\,\!</math> is the AC modulation voltage


:<math>n_{TE}\,\!</math> is the ordinary index of refraction
:<math>n_{eff}\,\!</math> is the ordinary index of refraction


:<math>n_{TM}\,\!</math> is the film refractive index
:<math>n_{TM}\,\!</math> is the film refractive index


=== References ===
=== References ===

Revision as of 15:14, 12 January 2010

Overview

Attenuated Total Reflection or ATR is a technique used together with Teng Mann to measure the R33 of electro-optic materials.

Technique

Significance

The electro-optic coefficient for a poled polymer film can be calculated as follows.

<math>r_{33} = \frac {2d\Delta R} {n^3_{TM} V_m} \frac {\delta n_{eff}} {\delta \theta} \left /( \frac {\delta R \delta n_{eff} } {\delta \theta \delta n_{TM} } \right ) \,\!</math>

where

<math>R\,\!</math> is the DC reflected signal
<math>V_m\,\!</math> is the AC modulation voltage
<math>n_{eff}\,\!</math> is the ordinary index of refraction
<math>n_{TM}\,\!</math> is the film refractive index

References