Difference between revisions of "Attenuated Total Reflectance"
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Cmditradmin (talk | contribs) m (→Significance) |
Cmditradmin (talk | contribs) m (→Significance) |
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where | where | ||
:<math>R\,\!</math> is the DC reflected signal | |||
:<math>V_m\,\!</math> is the AC modulation voltage | |||
:<math>n_{TE}\,\!</math> is the ordinary index of refraction | :<math>n_{TE}\,\!</math> is the ordinary index of refraction | ||
:<math>n_{TM}\,\!</math> is the | :<math>n_{TM}\,\!</math> is the film refractive index | ||
=== References === | === References === |
Revision as of 15:14, 12 January 2010
Overview
Attenuated Total Reflection or ATR is a technique used together with Teng Mann to measure the R33 of electro-optic materials.
Technique
Significance
The electro-optic coefficient for a poled polymer film can be calculated as follows.
- <math>r_{33} = \frac {2d\Delta R} {n^3_{TM} V_m} \frac {\delta n_{eff}} {\delta \theta} \left /( \frac {\delta R \delta n_{eff} } {\delta \theta \delta n_{TM} } \right ) \,\!</math>
where
- <math>R\,\!</math> is the DC reflected signal
- <math>V_m\,\!</math> is the AC modulation voltage
- <math>n_{TE}\,\!</math> is the ordinary index of refraction
- <math>n_{TM}\,\!</math> is the film refractive index