Difference between revisions of "Scanning Electron Microscope"
Jump to navigation
Jump to search
Cmditradmin (talk | contribs) m (→Operation) |
|||
| Line 9: | Line 9: | ||
=== Operation === | === Operation === | ||
{{#ev:youtube| | {{#ev:youtube|3oSbtV4BRRM}} | ||
{{#ev:youtube| | {{#ev:youtube|8LKnSZfnuIY}} | ||
{{#ev:youtube| | {{#ev:youtube|0a0xWxtMTE}} | ||
{{#ev:youtube| | {{#ev:youtube|QXm11ERNXUQ}} | ||
{{#ev:youtube| | {{#ev:youtube|8FH1I_2IcU}} | ||
{{#ev:youtube| | {{#ev:youtube|s1OabL2sLBo}} | ||
Revision as of 09:15, 21 December 2009
Overview
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.
See Wikipedia on Scanning Electron Microscope
Operation
Basic tour
(Remaining videos in production)
Training Manual for Sirion SEM[1]
Training Video on Hitachi 3500H SEM at GT MiRC