Difference between revisions of "Ellipsometer"
Jump to navigation
Jump to search
Cmditradmin (talk | contribs) m |
Cmditradmin (talk | contribs) m (→External Links) |
||
Line 20: | Line 20: | ||
=== External Links === | === External Links === | ||
*[[wikipedia:Ellipsometry]] |
Revision as of 14:13, 15 June 2011
Return to Research Tool Menu |
Overview
An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films.
see wikipedia on Ellipsometry
Significance
Operation
Video on operation of a Woolam Ellipsometer at MiRC