Difference between revisions of "Transmission Electron Microscope"

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=== Technique ===
=== Technique ===
Part 1
Part 1
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Part 2
Part 2

Revision as of 08:25, 29 June 2010

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Introduction

The transmission electron microscope (TEM) is used in photonics research as a way of visualizing and measuring extremely thin layers. It is well suited for this research because the devices and prototypes are often conductive, are extremely thin, and can withstand high vacuum.


Technique

Part 1

Part 2

External Links

See Wikipedia:Transmission_electron_microscope TEM

Brief Youtube intro