Difference between revisions of "Ellipsometer"
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=== Overview === | === Overview === | ||
Revision as of 13:08, 4 January 2010
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Overview
An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films.
see wikipedia on Ellipsometry
Technique
Video on operation of a Woolam Ellipsometer at MiRC