Difference between revisions of "Scanning Electron Microscope"
Cmditradmin (talk | contribs) m (→Operation) |
Cmditradmin (talk | contribs) m |
||
| Line 6: | Line 6: | ||
=== Operation === | === Operation === | ||
{{#ev:youtube|HyKOOcRh-Hk}} | |||
<object width="425" height="344"><param name="movie" value="http://www.youtube.com/v/HyKOOcRh-Hk&hl=en&fs=1"></param><param name="allowFullScreen" value="true"></param><param name="allowscriptaccess" value="always"></param><embed src="http://www.youtube.com/v/HyKOOcRh-Hk&hl=en&fs=1" type="application/x-shockwave-flash" allowscriptaccess="always" allowfullscreen="true" width="425" height="344"></embed></object> | <object width="425" height="344"><param name="movie" value="http://www.youtube.com/v/HyKOOcRh-Hk&hl=en&fs=1"></param><param name="allowFullScreen" value="true"></param><param name="allowscriptaccess" value="always"></param><embed src="http://www.youtube.com/v/HyKOOcRh-Hk&hl=en&fs=1" type="application/x-shockwave-flash" allowscriptaccess="always" allowfullscreen="true" width="425" height="344"></embed></object> | ||
Revision as of 15:43, 21 October 2009
Overview
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additioanal software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.
See Wikipedia on Scanning Electron Microscope
Operation
<object width="425" height="344"><param name="movie" value="http://www.youtube.com/v/HyKOOcRh-Hk&hl=en&fs=1"></param><param name="allowFullScreen" value="true"></param><param name="allowscriptaccess" value="always"></param><embed src="http://www.youtube.com/v/HyKOOcRh-Hk&hl=en&fs=1" type="application/x-shockwave-flash" allowscriptaccess="always" allowfullscreen="true" width="425" height="344"></embed></object>
Video in production
Training Manual for Sirion SEM[1]
Training Video on Hitachi 3500H SEM at GT MiRC