Difference between revisions of "Profilometer"
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see wikipedia [[http://en.wikipedia.org/wiki/Profilometer Profilometer]] | see wikipedia [[http://en.wikipedia.org/wiki/Profilometer Profilometer]] | ||
=== Technique === | |||
Video instructions for the [http://grover.mirc.gatech.edu/training/viewVideo.php?video=wyko-high&size=0 Wycko Profilometer at GT Microelectronics Research Center] | Video instructions for the [http://grover.mirc.gatech.edu/training/viewVideo.php?video=wyko-high&size=0 Wycko Profilometer at GT Microelectronics Research Center] | ||
=== Significance === | === Significance === | ||
Revision as of 08:30, 6 October 2009
Overview
Profilometer is an instrument that measures a surface's profile or roughness at the nanometer level. A contact profilometer has a diamond stylus that physically touches the surface. It is not sensitive to surface color or reflectance. Optical or non-contact profilometers scan the surface with light. A confocal microscopecan be used for characterizing a surface.
see wikipedia [Profilometer]
Technique
Video instructions for the Wycko Profilometer at GT Microelectronics Research Center