Difference between revisions of "Scanning Electron Microscope"

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=== Overview ===
=== Overview ===
[[Image:Sirion_sem.png|thumb|300px|]]
[[Image:Sirion_sem.png|thumb|300px|]]
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for [[E-beam lithography]] or are equipped for focused ion beam (FIB) milling. The SEM is a useful tool for photonics research because it reveals nano-scale surface features and topography that is critical to the performance of multi-layer devices.
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. The SEM is a useful tool for photonics research because it reveals nano-scale surface features and topography that is critical to the performance of multi-layer devices. SEM produces dramatic pictures that reveal 3D shapes and shadows.
 


=== Significance ===
=== Significance ===
In addition to producing detailed dramatic pictures that reveal 3D shapes the SEM can be equipped with auxilliary features so it be used for elemental analysis using EDAX and ebeam lithography.
Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for [[E-beam lithography]] or are equipped for focused ion beam (FIB) milling. SEM can be equipped with attachments so it be used for elemental analysis using Energy Disspersive X-ray spectroscopy EDAX.


=== Operation ===
=== Operation ===


Part 1 Tour and Sample Preparation
Part 1 Tour and Sample Preparation

Revision as of 08:02, 3 November 2011

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Overview

Sirion sem.png

The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. The SEM is a useful tool for photonics research because it reveals nano-scale surface features and topography that is critical to the performance of multi-layer devices. SEM produces dramatic pictures that reveal 3D shapes and shadows.

Significance

Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling. SEM can be equipped with attachments so it be used for elemental analysis using Energy Disspersive X-ray spectroscopy EDAX.

Operation

Part 1 Tour and Sample Preparation

Part 2 Loading the Sample

Part 3 Setting the Working Distance

Part 4 Lens Alignment and Stigmation

Part 5 Moving the Stage and Imaging

Part 6 Changing the Sample and Shutdown


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