Difference between revisions of "Scanning Electron Microscope"
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{{#ev:youtube|HyKOOcRh-Hk}} | {{#ev:youtube|HyKOOcRh-Hk}} | ||
Basic tour | Basic tour | ||
(Remaining videos in production) | |||
[http://www.youtube.com/watch?v=5OrK-VKfqH4 Stage details] | [http://www.youtube.com/watch?v=5OrK-VKfqH4 Stage details] | ||
Training Manual for Sirion SEM[http://depts.washington.edu/cmditr/media/siriontraining_rev8_04223.pdf] | Training Manual for Sirion SEM[http://depts.washington.edu/cmditr/media/siriontraining_rev8_04223.pdf] | ||
Revision as of 15:58, 21 October 2009
Overview
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additioanal software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.
See Wikipedia on Scanning Electron Microscope
Operation
Basic tour
(Remaining videos in production)
Training Manual for Sirion SEM[1]
Training Video on Hitachi 3500H SEM at GT MiRC