Difference between revisions of "Scanning Electron Microscope"
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=== Operation === | === Operation === | ||
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Basic tour | |||
Revision as of 15:44, 21 October 2009
Overview
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additioanal software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.
See Wikipedia on Scanning Electron Microscope
Operation
Basic tour
Video in production
Training Manual for Sirion SEM[1]
Training Video on Hitachi 3500H SEM at GT MiRC