Revision history of "File:Angle resolved xps.jpg"

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  • curprev 09:23, 22 April 2009‎ Cmditradmin talk contribs‎ 285 bytes +285‎ XPS is typically conducted with the sample perpendicular to the detector axis (normal takeoff angles) but if we want additional near-surface sensitivity we can tilt the sample. The above equation shows that tilting the sample gives us analytical informat
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