Difference between revisions of "Scanning Electron Microscope"
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=== Operation === | === Operation === | ||
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Basic tour | Basic tour | ||
(Remaining videos in production) | (Remaining videos in production) | ||
Revision as of 08:56, 3 November 2009
Overview
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.
See Wikipedia on Scanning Electron Microscope
Operation
Basic tour
(Remaining videos in production)
Training Manual for Sirion SEM[1]
Training Video on Hitachi 3500H SEM at GT MiRC