Difference between revisions of "Profilometer"
Jump to navigation
Jump to search
Cmditradmin (talk | contribs) m |
Cmditradmin (talk | contribs) m (→Overview) |
||
| Line 10: | Line 10: | ||
see wikipedia [[http://en.wikipedia.org/wiki/Profilometer Profilometer]] | see wikipedia [[http://en.wikipedia.org/wiki/Profilometer Profilometer]] | ||
<swf width="500" height="400">/images/3/35/Profilometer.swf</swf> | |||
=== Technique === | === Technique === | ||
Revision as of 10:25, 12 October 2010
| Return to Research Tool Menu |
Overview
Profilometer is an instrument that measures a surface's profile or roughness at the nanometer level. A contact profilometer has a diamond stylus that physically touches the surface. It is not sensitive to surface color or reflectance. Optical or non-contact profilometers scan the surface with light. A confocal microscopecan be used for characterizing a surface.
see wikipedia [Profilometer]
<swf width="500" height="400">/images/3/35/Profilometer.swf</swf>
Technique
Video instructions for the Wycko Profilometer at GT Microelectronics Research Center