Conducting Tip Atomic Force Microscopy - Revision history

Cmditradmin: /* Links */

2020-05-28T17:44:48Z

Links

← Older revision		Revision as of 10:44, 28 May 2020
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	[[category:Research equipment]]		[[category:Research equipment]]
	=== Links===		=== Links===
			[http://cei.washington.edu/educationspace/presentations/Piffy%20the%20Photoinduced%20Force%20Microscope.pdf Photoinduced Force Microscope]

	[https://cleanenergy.shinyapps.io/bundle/ Conducting tip AFM applet]		[https://cleanenergy.shinyapps.io/bundle/ Conducting tip AFM applet]

	[http://depts.washington.edu/nanolab/NUE_UNIQUE/NUE_UNIQUE_Workshop.htm Lab activities using AFM]		[http://depts.washington.edu/nanolab/NUE_UNIQUE/NUE_UNIQUE_Workshop.htm Lab activities using AFM]

Cmditradmin: /* Links */

2020-05-28T17:39:11Z

Links

← Older revision		Revision as of 10:39, 28 May 2020
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	[[category:Research equipment]]		[[category:Research equipment]]
	=== Links===		=== Links===

			[https://cleanenergy.shinyapps.io/bundle/ Conducting tip AFM applet]
	[http://depts.washington.edu/nanolab/NUE_UNIQUE/NUE_UNIQUE_Workshop.htm Lab activities using AFM]		[http://depts.washington.edu/nanolab/NUE_UNIQUE/NUE_UNIQUE_Workshop.htm Lab activities using AFM]

Cmditradmin at 21:49, 7 January 2019

2019-01-07T21:49:16Z

← Older revision		Revision as of 14:49, 7 January 2019
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	=== Links===		=== Links===
	[http://depts.washington.edu/nanolab/NUE_UNIQUE/NUE_UNIQUE_Workshop.htm Lab activities using AFM]		[http://depts.washington.edu/nanolab/NUE_UNIQUE/NUE_UNIQUE_Workshop.htm Lab activities using AFM]

	~~[http://www.nanoscience.com/education/gallery.html AFM animations]~~

Cmditradmin: /* Overview */

2010-08-09T18:59:43Z

Overview

← Older revision		Revision as of 11:59, 9 August 2010
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	Atomic Force Microscopy (AFM)is a well established process for visualizing ultrafine surface characteristics. In normal AFM scanning mode a fine needle is drawn very near a surface and is gently bent by the various atomic forces. The conducting tip gives you the chance to measure electrical conductivity at discrete locations and then correlate these measurement with the surface scan that reveals the shape.		Atomic Force Microscopy (AFM)is a well established process for visualizing ultrafine surface characteristics. In normal AFM scanning mode a fine needle is drawn very near a surface and is gently bent by the various atomic forces. The conducting tip gives you the chance to measure electrical conductivity at discrete locations and then correlate these measurement with the surface scan that reveals the shape.

	see [[wikipedia:Atomic_force_microscope ~~Atomic Force Microscopy~~]]		see [[wikipedia:Atomic_force_microscope]]

	=== Operation ===		=== Operation ===

Cmditradmin: /* Overview */

2010-08-09T18:52:59Z

Overview

← Older revision		Revision as of 11:52, 9 August 2010
Line 9:		Line 9:
	Atomic Force Microscopy (AFM)is a well established process for visualizing ultrafine surface characteristics. In normal AFM scanning mode a fine needle is drawn very near a surface and is gently bent by the various atomic forces. The conducting tip gives you the chance to measure electrical conductivity at discrete locations and then correlate these measurement with the surface scan that reveals the shape.		Atomic Force Microscopy (AFM)is a well established process for visualizing ultrafine surface characteristics. In normal AFM scanning mode a fine needle is drawn very near a surface and is gently bent by the various atomic forces. The conducting tip gives you the chance to measure electrical conductivity at discrete locations and then correlate these measurement with the surface scan that reveals the shape.

	see ~~Wikipedia~~ [~~http~~:~~//en.wikipedia.org/wiki/~~Atomic_force_microscope Atomic Force Microscopy]		see [[wikipedia:Atomic_force_microscope Atomic Force Microscopy]]


	=== Operation ===		=== Operation ===

Cmditradmin: /* Operation */

2010-06-24T22:47:45Z

Operation

← Older revision		Revision as of 15:47, 24 June 2010
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	This video is also available on YouTube:		This video is also available on YouTube:
	*[http://www.youtube.com/watch?v=H48w-aTE9pg AFM Video, Part 1]
	*[http:~~//www.~~youtube~~.com/watch?v=RLardiQXruY AFM Video,~~ Part 2]		AFM Video, Part 1]

			{{#ev:youtube\|H48w-aTE9pg}}

			Part 2

			{{#ev:youtube\|RLardiQXruY}}

	=== Significance ===		=== Significance ===

Cmditradmin at 22:46, 24 June 2010

2010-06-24T22:46:00Z

← Older revision		Revision as of 15:46, 24 June 2010
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	=== Links===		=== Links===
	[http://depts.washington.edu/nanolab/NUE_UNIQUE/NUE_UNIQUE_Workshop.htm Lab activities using AFM]		[http://depts.washington.edu/nanolab/NUE_UNIQUE/NUE_UNIQUE_Workshop.htm Lab activities using AFM]

			[http://www.nanoscience.com/education/gallery.html AFM animations]

Cmditradmin at 22:39, 24 June 2010

2010-06-24T22:39:55Z

← Older revision		Revision as of 15:39, 24 June 2010
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	]]		]]
	[[category:Research equipment]]		[[category:Research equipment]]
			=== Links===
			[http://depts.washington.edu/nanolab/NUE_UNIQUE/NUE_UNIQUE_Workshop.htm Lab activities using AFM]

Smhunter: /* Operation */

2010-05-13T16:18:05Z

Operation

← Older revision		Revision as of 09:18, 13 May 2010
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	<swf width="640" height="452">http://depts.washington.edu/cmditr/media/afm.swf</swf>		<swf width="640" height="452">http://depts.washington.edu/cmditr/media/afm.swf</swf>

			This video is also available on YouTube:
			*[http://www.youtube.com/watch?v=H48w-aTE9pg AFM Video, Part 1]
			*[http://www.youtube.com/watch?v=RLardiQXruY AFM Video, Part 2]

	=== Significance ===		=== Significance ===

Cmditradmin: /* Significance */

2010-01-04T17:52:11Z

Significance

← Older revision		Revision as of 10:52, 4 January 2010
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	[[Image:Itopics.png\|thumb\|500px\|center\|These C-AFM images demonstrate the electrical heterogeneity of the ITO surface. This lack of uniformity is due to carbonaceous impurities and hydroxide species contaminating the surface. Additionally it is unclear whether the ITO is composed of a single or multiple phases of varying electrical activity. Modification of the ITO surface can increase the electrical activity of the film by removing contaminant species and possible changing the relative ratio of phases present on the surface.		[[Image:Itopics.png\|thumb\|500px\|center\|These C-AFM images demonstrate the electrical heterogeneity of the ITO surface. This lack of uniformity is due to carbonaceous impurities and hydroxide species contaminating the surface. Additionally it is unclear whether the ITO is composed of a single or multiple phases of varying electrical activity. Modification of the ITO surface can increase the electrical activity of the film by removing contaminant species and possible changing the relative ratio of phases present on the surface.
			]]

			[[Image:ITO-IVCURVE.png\|thumb\|600px\|center\|Each semi-log plot on the left shows current-voltage curves at several different ~20 nm2 areas on the same organic film. The data indicate that the electrical heterogeneity of the ITO affects the current flowing through the above Copper Phthalocyanine layer (top row). The addition of a PEDOT:PSS mediator layer (bottom row) makes the electrode electrically uniform by allowing current to pass over any insulating regions on the ITO surface. The PEDOT:PSS/CuPc interface is also rectifying in such a manner as to collect photocurrent and suppress dark current.
			It should also be noted that the acid etch produces a surface that is already very uniform and is actually hindered by the addition of the PEDOT:PSS layer (right column).
	]]		]]
	[[category:Research equipment]]		[[category:Research equipment]]